Field Failure Mechanism Investigation of GaAs based HBT Power Amplifier Mmodule (PAM). - Jae-Seong Jeong; Jong-Shin Ha; Sang-Deuk Park (Microelectron. Reliab., 2004)

Stress Mechanism about Field Lightning Surge of High Voltage BJT Based Line Driver for ADSL System. - Jae-Seong Jeong; Jae-Hyun Lee; Jong-Shin Ha; Sang-Deuk Park (Microelectron. Reliab., 2005)

Field failure mechanism and improvement of EOS failure of integrated IGBT inverter modules. - Jae-Seong Jeong; Soon-Ha Hong; Sang-Deuk Park (Microelectron. Reliab., 2007)

Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED. - Jae-Seong Jeong; Jin-Kyu Jung; Sang-Deuk Park (Microelectron. Reliab., 2008)

Failure analysis of video processor defined as No Fault Found (NFF): Reproduction in system level and advanced analysis technique in IC level. - Jae-Seong Jeong; Sang-Deuk Park (Microelectron. Reliab., 2009)

An Efficient Method for Game Development using Compiler. - Jae-Seong Jeong; Soon Ghon Kim (ICEIS (3), 2010)

Failure mechanism of COF based Line Driver IC for Flat Panel Display by contamination. - Jae-Seong Jeong; Young Jeon Kim (Microelectron. Reliab., 2010)

Failure mechanism and reliability test method for USB interface circuitry on CPUs for mobile devices. - Jae-Seong Jeong (Microelectron. Reliab., 2012)

Field failure mechanism study of solder interconnection for crystalline silicon photovoltaic module. - Jae-Seong Jeong; Nochang Park; Changwoon Han (Microelectron. Reliab., 2012)

Field failure mechanism and reproduction due to moisture for low-voltage ZnO varistors. - Jae-Seong Jeong (Microelectron. Reliab., 2013)

Estimation of the degradation rate of multi-crystalline silicon photovoltaic module under thermal cycling stress. - Nochang Park; Jae-Seong Jeong; Changwoon Han (Microelectron. Reliab., 2014)

The degradation mechanism of flexible a-Si: H/μc-Si: H photovoltaic modules. - Jae-Seong Jeong; Yong-Hyun Kim; Chang-kyun Park; Heon-Do Kim; Joongho Choi (Microelectron. Reliab., 2015)

Effect of H/Ar treatment on ZnO: B transparent conducting oxide for flexible a-Si: H/μc-Si: H photovoltaic modules under damp heat stress. - Jae-Seong Jeong; Yong-Hyun Kim; Chang-kyun Park; Heon-Do Kim; Joongho Choi (Microelectron. Reliab., 2016)

Lifetime and failure analysis of perovskite-based ceramic NTC thermistors by thermal cycling and abrasion combined stress. - Jae-Seong Jeong; Won-kyoung Lee; Chung-kuk Lee; Joongho Choi (Microelectron. Reliab., 2017)