Functional unit duplication for reducing dynamic power. - Chi-Hoon Shin; Myeong-Hoon Oh; Jae-Woo Sim; Young-Woo Kim; Sung Nam Kim; Seongwoon Kim (IEICE Electron. Express, 2010)

Split-TCAM mechanism for storing patterns efficiently. - Jae-Woo Sim; Chan-Ho Park; Chi-Hoon Shin; Young Woo Kim; Seongwoon Kim (IEICE Electron. Express, 2010)