Efficient Simulation Model Generation Using Automatic Programming Techniques. - Jae-Wook Lee 007; Sungho Kang (WSC, 1996)

A 0.18 µm CMOS 3.125-Gb/s Digitally Controlled Adaptive Line Equalizer with Feed-Forward Swing Control for Backplane Serial Link. - Ki-Hyuk Lee; Jae-Wook Lee 007; Woo-Young Choi (IEICE Trans. Electron., 2006)

8Gb 3D DDR3 DRAM using through-silicon-via technology. - Uksong Kang; Hoeju Chung; Seongmoo Heo; Soon-Hong Ahn; Hoon Lee; Sooho Cha; Jaesung Ahn; Dukmin Kwon; Jin Ho Kim; Jae-Wook Lee 007; Han-Sung Joo; Woo-Seop Kim; et al. (ISSCC, 2009)

8 Gb 3-D DDR3 DRAM Using Through-Silicon-Via Technology. - Uksong Kang; Hoeju Chung; Seongmoo Heo; Dukha Park; Hoon Lee; Jin Ho Kim; Soon-Hong Ahn; Sooho Cha; Jaesung Ahn; Dukmin Kwon; Jae-Wook Lee 007; Han-Sung Joo; et al. (IEEE J. Solid State Circuits, 2010)

A 58nm 1.8V 1Gb PRAM with 6.4MB/s program BW. - Hoeju Chung; Byung-Hoon Jeong; ByungJun Min; Youngdon Choi; Beak-Hyung Cho; Junho Shin; Jinyoung Kim; Jung Sunwoo; Joon-min Park; Qi Wang; Yong-jun Lee; Sooho Cha; et al. (ISSCC, 2011)

A 20nm 1.8V 8Gb PRAM with 40MB/s program bandwidth. - Youngdon Choi; Ickhyun Song; Mu-Hui Park; Hoeju Chung; Sanghoan Chang; Beakhyoung Cho; Jinyoung Kim; Younghoon Oh; Dukmin Kwon; Jung Sunwoo; Junho Shin; Yoohwan Rho; et al. (ISSCC, 2012)

18.2 A 1.2V 20nm 307GB/s HBM DRAM with at-speed wafer-level I/O test scheme and adaptive refresh considering temperature distribution. - Kyomin Sohn; Won-Joo Yun; Reum Oh; Chi-Sung Oh; Seong-Young Seo; Min-Sang Park; Dong-Hak Shin; Won-Chang Jung; Sang-Hoon Shin; Je-Min Ryu; Hye-Seung Yu; Jae-Hun Jung; et al. (ISSCC, 2016)

22.1 A 1.1V 16GB 640GB/s HBM2E DRAM with a Data-Bus Window-Extension Technique and a Synergetic On-Die ECC Scheme. - Chi-Sung Oh; Ki Chul Chun; Young-Yong Byun; Yong-Ki Kim; So-Young Kim; Yesin Ryu; Jaewon Park; Sinho Kim; Sang-uhn Cha; Dong-Hak Shin; Jungyu Lee 002; Jong-Pil Son; et al. (ISSCC, 2020)