Zero-overhead self test and calibration of RF transceivers. - Afsaneh Nassery; Jae Woong Jeong; Sule Ozev (ITC, 2013)

Measurement of envelope/phase path delay skew and envelope path bandwidth in polar transmitters. - Jae Woong Jeong; Sule Ozev; Shreyas Sen; T. M. Mak (VTS, 2013)

Built-in self-test and characterization of polar transmitter parameters in the loop-back mode. - Jae Woong Jeong; Sule Ozev; Shreyas Sen; Vishwanath Natarajan; Mustapha Slamani (DATE, 2014)

Development and empirical verification of an accuracy model for the power down leakage tests. - Jae Woong Jeong; Sule Ozev; Friedrich Taenzler; Hui-Chuan Chao (VTS, 2014)

Robust amplitude measurement for RF BIST applications. - Jae Woong Jeong; Jennifer Kitchen; Sule Ozev (ETS, 2015)

A self-compensating built-in self-test solution for RF phased array mismatch. - Jae Woong Jeong; Jennifer Kitchen; Sule Ozev (ITC, 2015)

Process independent gain measurement with low overhead via BIST/DUT co-design. - Jae Woong Jeong; Jennifer Kitchen; Sule Ozev (VTS, 2016)

Built-In Self-Test and Digital Calibration of Zero-IF RF Transceivers. - Jae Woong Jeong; Afsaneh Nassery; Jennifer N. Kitchen; Sule Ozev (IEEE Trans. Very Large Scale Integr. Syst., 2016)

Evaluation of loop transfer function based dynamic testing of LDOs. - Mehmet Ince; Ender Yilmaz; Jae Woong Jeong; LeRoy Winemberg; Sule Ozev (ITC-Asia, 2017)

Built-in self-test for stability measurement of low dropout regulator. - Jae Woong Jeong; Ender Yilmaz; LeRoy Winemberg; Sule Ozev (ITC, 2017)

Advanced Data Communication Framework for Cloud Computing from CDMI. - Jae-Yun Jeong; Jae Woong Jeong (MUE/FutureTech, 2017)

A Study on the Serious Issues in the Practice of Information Security in IT: With a Focus on Ransomware. - Junhak Lee; Jae Woong Jeong (MUE/FutureTech, 2017)

A Study of AI Based E-learning System and Application. - Min-Gyu Shim; Jae Woong Jeong (MUE/FutureTech, 2017)

A Comprehensive BIST Solution for Polar Transceivers Using On-Chip Resources. - Jae Woong Jeong; Vishwanath Natarajan; Shreyas Sen; T. M. Mak; Jennifer Kitchen; Sule Ozev (ACM Trans. Design Autom. Electr. Syst., 2017)

On-Chip RF Phased Array Characterization with DC-Only Measurements for In-Field Calibration. - Jae Woong Jeong; Jennifer Kitchen; Sule Ozev (IEEE Des. Test, 2019)