Process Improvements for 7th Generation 1Tb Quad-Level Cell 3D NAND Flash Memory in Mass Production. - Soochan Chung; Dong-Hyeon Ko; Joonsung Lim; Kyungmoon Kim; Sejie Takaki; Yujeong Seo; Byoungil Lee; Sejun Park; Jaeduk Lee; Kyungyoon Noh; Sujin Ahn; Sunghoi Hur (IMW, 2023)

High Bit Cost Scalability and Reliable Cell Characteristics for 7th Generation 1Tb 4Bit/Cell 3D-NAND Flash. - Kyungmoon Kim; Yujeong Seo; Sejun Park; Woojae Jang; Dongho Yoo; Joonsung Lim; Il-Han Park; Jaeduk Lee; Kyungyoon Noh; Sujin Ahn; Sunghoi Hur (VLSI Technology and Circuits, 2023)

Novel Strategies for Highly Uniform and Reliable Cell Characteristics of 8th Generation 1Tb 3D-NAND Flash Memory. - Changhwan Lee; Min-Tai Yu; Sejun Park; Hoki Lee; Bio Kim; Suhwan Lim; Jaeduk Lee; Sung-Hun Lee; Mincheol Park; Sujin Ahn; Sunghoi Hur (VLSI Technology and Circuits, 2023)

Wireless Channel Adaptive DNN Split Inference for Resource-Constrained Edge Devices. - Jaeduk Lee; Hojung Lee; Wan Choi 001 (IEEE Commun. Lett., 2023)

A Novel Quantitative Model for Combination Effects of Hydrogen and Process Heat on Peripheral Transistors in 3D-NAND Flash Memory. - Dongjin Lee; Yunjo Lee; Soyeong Na; KangOh Yun; Sungkweon Baek; Jaeduk Lee; Jaehoon Jang 002; Jaihyuk Song (IRPS, 2024)