A Defect Detection Model for Imbalanced Wafer Image Data Using CAE and Xception. - Jaegyeong Cha; Seokju Oh; Donghyun Kim 005; Jongpil Jeong (IDSTA, 2020)

AnoGAN-Based Anomaly Filtering for Intelligent Edge Device in Smart Factory. - Donghyun Kim 005; Jaegyeong Cha; Seokju Oh; Jongpil Jeong (IMCOM, 2021)

A Novel Defect Classification Scheme Based on Convolutional Autoencoder with Skip Connection in Semiconductor Manufacturing. - Jaegyeong Cha; Juyong Park; Jongpil Jeong (ICACT, 2022)