Instruction-based March Test Pattern Generation Scheme for At-Speed Test Cost Reduction. - Seokmin Park; Gayeong Lee; Jaehwan Shin; Seunghan Lee; Young-Woo Lee (ICAIIC, 2023)

Production-Oriented Design for High Parallel Test Efficiency. - Jaehwan Shin; Young-Woo Lee (ISOCC, 2024)