A Novel Method Using a Rectangular Groove to Reduce Far-End Crosstalk in Microstrip Lines Covered With a Dielectric Layer. - Jaehyuk Lim; Seungjin Lee; Youngjin Jeong; Jaehoon Lee (IEEE Access, 2019)

Machine Learning (ML)-Based Model to Characterize the Line Edge Roughness (LER)-Induced Random Variation in FinFET. - Jaehyuk Lim; Changhwan Shin (IEEE Access, 2020)

Probabilistic Artificial Neural Network for Line-Edge-Roughness-Induced Random Variation in FinFET. - Jaehyuk Lim; Jinwoong Lee; Changhwan Shin (IEEE Access, 2021)

GAN-Based Framework for Unified Estimation of Process-Induced Random Variation in FinFET. - Taeeon Park; Jihwan Kwak; Hongjoon Ahn; Jinwoong Lee; Jaehyuk Lim; Sangho Yu; Changhwan Shin; Taesup Moon (IEEE Access, 2022)

Language Models Don't Learn the Physical Manifestation of Language. - Bruce W. Lee; Jaehyuk Lim (ACL (1), 2024)

Tasks That Language Models Don't Learn. - Bruce W. Lee; Jaehyuk Lim (CoRR, 2024)

Measuring Visual Sycophancy in Multimodal Models. - Jaehyuk Lim; Bruce W. Lee (CoRR, 2024)

Robust Anti-Jamming Method for Large-Array Radar Systems Using Deep Learning Based Null-Space Beamforming. - Jaehyuk Lim; Hogeun Yoo; Euihyuk Lee; Sunjin Oh; Jaehoon Lee (IEEE Access, 2025)

Utility Engineering: Analyzing and Controlling Emergent Value Systems in AIs. - Mantas Mazeika; Xuwang Yin; Rishub Tamirisa; Jaehyuk Lim; Bruce W. Lee; Richard Ren; Long Phan; Norman Mu; Adam Khoja; Oliver Zhang; Dan Hendrycks (CoRR, 2025)

Device Design Guidelines to Boost Up AC Performance of CFET (Complementary Field-Effect-Transistor)-Based Inverter. - Jaehyuk Lim; Donghwan Han; Juho Sung; Seokchan Yoon; Sanghyun Kang; Gwon Kim; Hyoung Won Baac; Changhwan Shin (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2025)