Voltage Boosted Fail Detecting Circuit for Selective Write Assist and Cell Current Boosting for High-Density Low-Power SRAM. - Jaehyun Park 014; Sangheon Lee 005; Hanwool Jeong (IEEE Trans. Circuits Syst. I Regul. Pap., 2023)

Cross-Coupled nFET Preamplifier for Low Voltage SRAM. - Sangheon Lee 005; Jaehyun Park 014; Hanwool Jeong (IEEE Trans. Circuits Syst. II Express Briefs, 2023)

Post-Layout Parasitic Capacitance Prediction Methodology Using Bayesian Optimization. - Giseok Kim; Jaehyun Park 014; Seong-Ook Jung (ICEIC, 2024)