Mining the relationship between production and customer service data for failure analysis of industrial products. - Seokho Kang 001; Eunji Kim 001; Jaewoong Shim; Sungzoon Cho; Wonsang Chang; Junhwan Kim (Comput. Ind. Eng., 2017)

Product failure prediction with missing data. - Seokho Kang 001; Eunji Kim 001; Jaewoong Shim; Wonsang Chang; Sungzoon Cho (Int. J. Prod. Res., 2018)

Kernel Rotation Forests for Classification. - Jaewoong Shim; Seokho Kang 001; Sungzoon Cho (BigComp, 2020)

Adaptive fault detection framework for recipe transition in semiconductor manufacturing. - Jaewoong Shim; Sungzoon Cho; Euiseok Kum; Suho Jeong (Comput. Ind. Eng., 2021)

Active cluster annotation for wafer map pattern classification in semiconductor manufacturing. - Jaewoong Shim; Seokho Kang 001; Sungzoon Cho (Expert Syst. Appl., 2021)

Domain-adaptive active learning for cost-effective virtual metrology modeling. - Jaewoong Shim; Seokho Kang 001 (Comput. Ind., 2022)

Learning from single-defect wafer maps to classify mixed-defect wafer maps. - Jaewoong Shim; Seokho Kang 001 (Expert Syst. Appl., 2023)

Environmentally-Robust Defect Classification With Domain Augmentation Framework. - Sungho Lee; Jaewoong Shim (IEEE Access, 2024)

Generalized zero-shot learning for classifying unseen wafer map patterns. - Han Kyul Kim; Jaewoong Shim (Eng. Appl. Artif. Intell., 2024)

Why does this query need to be labeled?: Enhancing active learning through explanation-based interventions in query selection. - Jaewoong Shim; Seokho Kang 001 (Expert Syst. Appl., 2025)