Modeling of Charge Failure Mechanisms during the Short Term Retention Depending on Program/Erase Cycle Counts in 3-D NAND Flash Memories. - Changbeom Woo; Shinkeun Kim; Jaeyeol Park; Hyungcheol Shin; Haesoo Kim; Gil-Bok Choi; Moon-Sik Seo; Keum Hwan Noh (IRPS, 2020)

Look Before You Access: Efficient Heap Memory Safety for Embedded Systems on ARMv8-M. - Jeonghwan Kang; Jaeyeol Park; Jiwon Seo; Donghyun Kwon (DAC, 2024)