A 1.8 Gb/s/pin 16Tb NAND Flash Memory Multi-Chip Package with F-Chip of Toggle 4.0 Specification for High Performance and High Capacity Storage Systems. - Jang-Woo Lee; Dae-Hoon Na; Anil Kavala; Hwasuk Cho; Junha Lee; Manjae Yang; Eunjin Song; Tongsung Kim; Seon-Kyoo Lee; Dong-Su Jang; Byung-Kwan Chun; Youngmin Jo; et al. (VLSI Circuits, 2020)

A Hybrid ZQ Calibration Design for High-Density Flash Memory Toggle 5.0 High-speed Interface. - Tongsung Kim; Anil Kavala; Hyunsuk Kang; Youngmin Jo; Jungjune Park; Kyoungtae Kang; Byung-Kwan Chun; Dong-Ho Shin; Dong-Su Jang; Byunghoon Jeong; Chiweon Yoon; Jinyub Lee; et al. (A-SSCC, 2021)

Issues and Key Technologies for Next Generation 3D NAND. - Chiweon Yoon; Hyunggon Kim; Seon-Kyoo Lee; Jinyub Lee; Jai Hyuk Song (ICEIC, 2021)

A 512Gb 3b/Cell 7th -Generation 3D-NAND Flash Memory with 184MB/s Write Throughput and 2.0Gb/s Interface. - Jiho Cho; D. Chris Kang; Jongyeol Park; Sangwan Nam; Jung-Ho Song; Bong-Kil Jung; Jaedoeg Lyu; Hogil Lee; Won-Tae Kim 004; Hongsoo Jeon; Sunghoon Kim 001; In-Mo Kim; et al. (ISSCC, 2021)

A 1.8-Gb/s/Pin 16-Tb NAND Flash Memory Multi-Chip Package With F-Chip for High-Performance and High-Capacity Storage. - Dae-Hoon Na; Jang-Woo Lee; Seon-Kyoo Lee; Hwasuk Cho; Junha Lee; Manjae Yang; Eunjin Song; Anil Kavala; Tongsung Kim; Dong-Su Jang; Youngmin Jo; Ji-Yeon Shin; et al. (IEEE J. Solid State Circuits, 2021)

Cell Operation Technologies to Overcome Scale-down Issues in 3D NAND Flash Memory. - Wandong Kim; Dae-Seok Byeon; Sung-Min Joe; Jinyub Lee; Jai Hyuk Song (ICEIC, 2022)

Machine Learning for Product Engineering in NAND Flash Memory. - Jongmin Kim; Earl Kim; Jeongin Choe; Ki-Whan Song; Eun-Kyoung Kim; Jai Hyuk Song (ICEIC, 2022)

Development of 7th generation 3D VNAND Flash Product with COP structure for Growing Demand in Storage Market. - Joonsung Lim; Soochan Chung; Dong-Hyeon Ko; Suk-Kang Sung; Kyungyoon Noh; Sujin Ahn; Jai Hyuk Song (ICEIC, 2022)

Electric Field Impact on Lateral Charge Diffusivity in Charge Trapping 3D NAND Flash Memory. - Juwon Lee; Junho Seo; Jeonghun Nam; YongLae Kim; Ki-Whan Song; Jai Hyuk Song; Woo Young Choi (IRPS, 2022)

Novel Electrical Detection Method for Random Defects on Peripheral Circuits in NAND Flash Memory. - Bu-Il Nam; Young-Ha Choi; Sungki Hong; Ki-Young Dong; Wontaeck Jung; Sang-Won Park; Soon-Yong Lee; Dooyeun Jung; Byoung-Hee Kim; Eun-Kyoung Kim; Ki-Whan Song; Jai Hyuk Song; et al. (IRPS, 2022)

A 1Tb 3b/Cell 8th-Generation 3D-NAND Flash Memory with 164MB/s Write Throughput and a 2.4Gb/s Interface. - Moosung Kim; Sung-Won Yun; Jungjune Park; Hyun Kook Park; Jungyu Lee 002; Yeong Seon Kim; Dae-Hoon Na; Sara Choi; Youngsun Song; Jonghoon Lee; Hyun-Jun Yoon; Kangbin Lee; et al. (ISSCC, 2022)