Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures. - Alexander Grill; Erik Bury; Jakob Michl; Stanislav Tyaginov; Dimitri Linten; Tibor Grasser; Bertrand Parvais; Ben Kaczer; Michael Waltl; Iuliana P. Radu (IRPS, 2020)

Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures. - Jakob Michl; Alexander Grill; Dieter Claes; Gerhard Rzepa; Ben Kaczer; Dimitri Linten; Iuliana P. Radu; Tibor Grasser; Michael Waltl (IRPS, 2020)

Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors. - Alexander Grill; V. John; Jakob Michl; A. Beckers; Erik Bury; Stanislav Tyaginov; Bertrand Parvais; Adrian Vaisman Chasin; Tibor Grasser; Michael Waltl; Ben Kaczer; Bogdan Govoreanu (IRPS, 2022)