Integrated pin electronics for VLSI functional testers. - James A. Gasbarro; Mark A. Horowitz (IEEE J. Solid State Circuits, 1989)

A 500-megabyte/s data-rate 4.5 M DRAM. - Natsuki Kushiyama; Shigeo Ohshima; Don Stark 001; Hiroyuki Noji; Kiyofumi Sakurai; Satoru Takase; Torhu Furuyama; Richard M. Barth; Andy Chan; John Dillon; James A. Gasbarro; Matthew M. Griffin; et al. (IEEE J. Solid State Circuits, 1993)

Testing High Speed Drams. - James A. Gasbarro (ITC, 1994)

Techniques for Characterizing DRAMs With a 500-MHz Interface. - James A. Gasbarro; Mark Horowitz (ITC, 1994)