Circular BIST with Partial Scan. - M. M. Pradhan; E. J. O'Brien; S. L. Lam; James Beausang (ITC, 1988)

Integrating Scan into Hierarchical Synthesis Methodologies. - James Beausang; Chris Ellingham; Markus Robinson (ITC, 1996)

A Symbolic Simulation-Based ANSI/IEEE Std 1149.1 Compliance Checker and BSDL Generator. - Harbinder Singh; James Beausang; Girish Patankar (ITC, 1997)

A new approach to scan chain reordering using physical design information. - Mokhtar Hirech; James Beausang; Xinli Gu (ITC, 1998)