Diagnosis and characterization of timing-related defects by time-dependent light emission. - Daniel R. Knebel; Pia N. Sanda; Moyra K. McManus; Jeffrey A. Kash; James C. Tsang; David P. Vallett; Leendert M. Huisman; Phil Nigh; Rick Rizzolo; Peilin Song; Franco Motika (ITC, 1998)

Backside optical emission diagnostics for excess IDDQ. - Jeffrey A. Kash; James C. Tsang; Richard F. Rizzolo; A. K. Patel; A. D. Shore (IEEE J. Solid State Circuits, 1998)

Picosecond imaging circuit analysis. - James C. Tsang; Jeffrey A. Kash; David P. Vallett (IBM J. Res. Dev., 2000)

Time-resolved optical characterization of electrical activity in integrated circuits. - James C. Tsang; Jeffrey A. Kash; David P. Vallett (Proc. IEEE, 2000)

Why hot carrier emission based timing probes will work for 50 nm, 1V CMOS technologies. - James C. Tsang; Massimo V. Fischetti (Microelectron. Reliab., 2001)

Optical diagnosis of excess IDDQ in low power CMOS circuits. - Franco Stellari; Peilin Song; James C. Tsang; Moyra K. McManus; Mark B. Ketchen (Microelectron. Reliab., 2002)