Implementation of Solder-bead Probing in High Volume Manufacturing. - Madhavan Doraiswamy; James J. Grealish (ITC, 2006)

Solving In-Circuit Defect Coverage Holes with a Novel Boundary Scan Application. - Dave F. Dubberke; James J. Grealish; Bill Van Dick (ITC, 2008)

Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox. - Zoe Conroy; James J. Grealish; Harrison Miles; Anthony J. Suto; Alfred L. Crouch; Skip Meyers (ITC, 2012)