Test Generation In Lamp2: System Overview. - Miron Abramovici; James J. Kulikowski; Premachandran R. Menon; David T. Miller (ITC, 1985)

Test Generation In Lamp2: Concepts and Algorithms. - Miron Abramovici; James J. Kulikowski; Premachandran R. Menon; David T. Miller (ITC, 1985)

SMART and FAST: Test Generation for VLSI Scan-Design Circuits. - Miron Abramovici; James J. Kulikowski; Premachandran R. Menon; David T. Miller (IEEE Des. Test, 1986)

System-level design verification in the AT&T Computer Division: tools. - Miron Abramovici; James J. Kulikowski; David T. Miller; Prem R. Menon (ICCD, 1989)

The Best Flip-Flops to Scan. - Miron Abramovici; James J. Kulikowski; Rabindra K. Roy (ITC, 1991)