DeepFreak: Learning Crystallography Diffraction Patterns with Automated Machine Learning. - Artur L. F. Souza; Leonardo B. Oliveira; Sabine Hollatz; Matthew Feldman; Kunle Olukotun; James M. Holton; Aina E. Cohen; Luigi Nardi (CoRR, 2019)

Accelerating x-ray tracing for exascale systems using Kokkos. - Felix Wittwer; Nicholas K. Sauter; Derek Mendez; Billy K. Poon; Aaron S. Brewster; James M. Holton; Michael E. Wall; William E. Hart; Deborah Bard; Johannes P. Blaschke (Concurr. Comput. Pract. Exp., 2024)