Monte Carlo Simulation of the Photoelectron Crosstalk in Silicon Imaging Devices. - James P. Lavine; Win-Chyi Chang; Constantine N. Anagnostopoulos; Bruce C. Burkey; E. T. Nelson (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1985)

High-resolution interline image sensors using two-phase CCD technology. - David N. Nichols; Eric G. Stevens; Bruce C. Burkey; Charles V. Stancampiano; Yung-Rai Lee; Teh-Hsuang Lee; Stephen L. Kosman; David L. Losee; James P. Lavine; G. R. Torok; R. P. Khosla (Int. J. Imaging Syst. Technol., 1994)