Time sequence ordering extensions to the Entity-Relationship model and their application to the automated manufacturing process. - James R. Moyne; Toby J. Teorey; Leo C. McAfee Jr. (Data Knowl. Eng., 1991)

A Design Methodology for Databases with Uncertain Data. - Nauman A. Chaudhry; James R. Moyne; Elke A. Rundensteiner (SSDBM, 1994)

A Formal Model for Rule Inheritance and Overriding in Active Object-Oriented Databases. - Nauman A. Chaudhry; James R. Moyne; Elke A. Rundensteiner (IADT, 1998)

An Extended Database Design Methodology for Uncertain Data Management. - Nauman A. Chaudhry; James R. Moyne; Elke A. Rundensteiner (Inf. Sci., 1999)

Control performance study of a networked machining cell. - Feng-Li Lian; James R. Moyne; Dawn M. Tilbury (ACC, 2000)

Analysis and modeling of networked control systems: MIMO case with multiple time delays. - Feng-Li Lian; James R. Moyne; Dawn M. Tilbury (ACC, 2001)

Optimal controller design and evaluation for a class of networked control systems with distributed constant delays. - Feng-Li Lian; James R. Moyne; Dawn M. Tilbury (ACC, 2002)

Using deadbands to reduce communication in networked control systems. - Paul G. Otanez; James R. Moyne; Dawn M. Tilbury (ACC, 2002)

Design of sampling and transmission rates for achieving control and communication performance in networked agent systems. - Feng-Li Lian; John K. Yook; Paul G. Otanez; Dawn M. Tilbury; James R. Moyne (ACC, 2003)

Network Protocols for Networked Control Systems. - Feng-Li Lian; James R. Moyne; Dawn M. Tilbury (Handbook of Networked and Embedded Control Systems, 2005)

On-line control reconfiguration at the machine and cell levels: case studies from the reconfigurable factory testbed. - Jonathan E. Luntz; James R. Moyne; Dawn M. Tilbury (ETFA, 2005)

Experimental determination of network quality of service in Ethernet: UDP, OPC, and VPN. - Jonathan Parrott; James R. Moyne; Dawn M. Tilbury (ACC, 2006)

PLC Communication using PROFINET: Experimental Results and Analysis. - Marco Antolovic; Kristen Acton; Naveen Kalappa; Siddharth Mantri; Jonathan Parrott; Jonathan E. Luntz; James R. Moyne; Dawn M. Tilbury (ETFA, 2006)

Experimental Determination of Real Time Peer to Peer Communication Characteristics of EtherNet/IP. - Naveen Kalappa; Kristen Acton; Marco Antolovic; Siddharth Mantri; Jonathan Parrott; Jonathan E. Luntz; James R. Moyne; Dawn M. Tilbury (ETFA, 2006)

Dedicated vs. Shared Networks for Safety and Controls: An analysis of the trade-offs involved. - Bradley Triden; Siddharth Mantri; Kyle Schroeder; Aditya Thomas; James R. Moyne; Dawn M. Tilbury (ETFA, 2006)

Network architecture and communication modules for guaranteeing acceptable control and communication performance for networked multi-agent systems. - Feng-Li Lian; John K. Yook; Dawn M. Tilbury; James R. Moyne (IEEE Trans. Ind. Informatics, 2006)

The Emergence of Industrial Control Networks for Manufacturing Control, Diagnostics, and Safety Data. - James R. Moyne; Dawn M. Tilbury (Proc. IEEE, 2007)

Factory-level control consolidation using Event-Condition-Action: Case study on the reconfigurable factory testbed. - Lindsay V. Allen; Jing Zhang; James R. Moyne; Dawn M. Tilbury (ACC, 2008)

A Factory Health Monitor: System identification, process monitoring, and control. - Kyle Schroeder; James R. Moyne; Dawn M. Tilbury (CASE, 2008)

Verification of ECA rule based management and control systems. - Jing Zhang; James R. Moyne; Dawn M. Tilbury (CASE, 2008)

Networked Control Systems for Manufacturing: Parameterization, Differentiation, Evaluation and Application. - James R. Moyne; Dawn M. Tilbury (Networked Embedded Systems, 2009)

Performance evaluation of wireless networks for factory automation applications. - Dhananjay M. Anand; James R. Moyne; Dawn M. Tilbury (CASE, 2009)

A practical implementation of distributed system control over an asynchronous Ethernet network using time stamped data. - Dhananjay M. Anand; Jeffrey G. Fletcher; Ya-Shian Li-Baboud; James R. Moyne (CASE, 2010)

An IEEE 1588 performance testing dashboard for power industry requirements. - Julien Amelot; Jeffrey G. Fletcher; Ya-Shian Li-Baboud; Dhananjay M. Anand; Clement Vasseur; James R. Moyne (PerMIS, 2012)

The Factory Integration Roadmap in Semiconductor manufacturing. - James R. Moyne; Martin Schellenberger; Lothar Pfitzner (ESSDERC, 2014)

A Hierarchical Incentive Arbitration Scheme for Coordinated PEV Charging Stations. - Dhananjay M. Anand; Rupert Tull de Salis; Yijie Cheng; James R. Moyne; Dawn M. Tilbury (IEEE Trans. Smart Grid, 2015)

Run-to-Run Control in Semiconductor Manufacturing. - James R. Moyne (Encyclopedia of Systems and Control, 2015)

Categorization of Anomalies in Smart Manufacturing Systems to Support the Selection of Detection Mechanisms. - Felipe Lopez; Miguel Saez; Yuru Shao; Efe C. Balta; James R. Moyne; Zhuoqing Morley Mao; Kira Barton; Dawn M. Tilbury (IEEE Robotics Autom. Lett., 2017)

Conflict-driven Hybrid Observer-based Anomaly Detection. - Zheng Wang; Farshad Harirchi; Dhananjay M. Anand; Chee Yee Tang; James R. Moyne; Dawn M. Tilbury (ACC, 2018)

Dynamic Rerouting of Cyber-Physical Production Systems in Response to Disruptions Based on SDC Framework. - Yassine Qamsane; Efe C. Balta; James R. Moyne; Dawn M. Tilbury; Kira Barton (ACC, 2019)

A Unified Digital Twin Framework for Real-time Monitoring and Evaluation of Smart Manufacturing Systems. - Yassine Qamsane; Chien-Ying Chen; Efe C. Balta; Bin-Chou Kao; Sibin Mohan; James R. Moyne; Dawn M. Tilbury; Kira Barton (CASE, 2019)

Towards Automated Safety Vetting of PLC Code in Real-World Plants. - Mu Zhang 001; Chien-Ying Chen; Bin-Chou Kao; Yassine Qamsane; Yuru Shao; Yikai Lin; Elaine Shi; Sibin Mohan; Kira Barton; James R. Moyne; Z. Morley Mao (IEEE Symposium on Security and Privacy, 2019)

A Requirements Driven Digital Twin Framework: Specification and Opportunities. - James R. Moyne; Yassine Qamsane; Efe C. Balta; Ilya Kovalenko; John Faris; Kira Barton; Dawn M. Tilbury (IEEE Access, 2020)

A Methodology to Develop and Implement Digital Twin Solutions for Manufacturing Systems. - Yassine Qamsane; James R. Moyne; Maxwell Toothman; Ilya Kovalenko; Efe C. Balta; John Faris; Dawn M. Tilbury; Kira Barton (IEEE Access, 2021)

Merging Subject Matter Expertise and Deep Convolutional Neural Network for State-Based Online Machine-Part Interaction Classification. - Hao Wang; Yassine Qamsane; James R. Moyne; Kira Barton (CoRR, 2021)

Trend-Based Repair Quality Assessment for Industrial Rotating Equipment. - Maxwell Toothman; Birgit Braun; Scott J. Bury; Michael Dessauer; Kaytlin Henderson; Ray Wright; Dawn M. Tilbury; James R. Moyne; Kira Barton (IEEE Control. Syst. Lett., 2021)

Toward an Automated Learning Control Architecture for Cyber-Physical Manufacturing Systems. - Ilya Kovalenko; James R. Moyne; Mingjie Bi; Efe C. Balta; Wenyuan Ma; Yassine Qamsane; Xiao Zhu 001; Z. Morley Mao; Dawn M. Tilbury; Kira Barton (IEEE Access, 2022)

An Adaptive, State-Based Framework for Fault Prediction in Rotating Equipment. - Maxwell Toothman; Birgit Braun; Scott J. Bury; James R. Moyne; Dawn M. Tilbury; Kira Barton (CASE, 2023)

Opportunities and Challenges to Integrate Artificial Intelligence into Manufacturing Systems: Thoughts from a Panel Discussion. - Ilya Kovalenko; Kira Barton; James R. Moyne; Dawn M. Tilbury (CoRR, 2023)

Overcoming Challenges Associated with Developing Industrial Prognostics and Health Management Solutions. - Maxwell Toothman; Birgit Braun; Scott J. Bury; James R. Moyne; Dawn M. Tilbury; Yixin Ye; Kira Barton (Sensors, 2023)

Opportunities and Challenges to Integrate Artificial Intelligence Into Manufacturing Systems: Thoughts From a Panel Discussion [Opinion]. - Ilya Kovalenko; Kira Barton; James R. Moyne; Dawn M. Tilbury (IEEE Robotics Autom. Mag., 2023)

A digital twin framework for prognostics and health management. - Maxwell Toothman; Birgit Braun; Scott J. Bury; James R. Moyne; Dawn M. Tilbury; Yixin Ye; Kira Barton (Comput. Ind., 2023)

How Lithography and Metrology Are Enabling Yield in the Next Generation of Semiconductor Patterning. - Mark O. Neisser; Ndubuisi G. Orji; Harry J. Levinson; Umberto Celano; James R. Moyne; Supika Mashiro; Dan Wilcox; Slava Libman (Computer, 2024)

Digital Twin-Based Cyber-Attack Detection Framework for Cyber-Physical Manufacturing Systems. - Efe C. Balta; Michael Pease; James R. Moyne; Kira Barton; Dawn M. Tilbury (IEEE Trans Autom. Sci. Eng., 2024)