Bounding Communication Energy Overhead in Parallel Networks with Power-Delay Scalability. - James S. Tandon; Steven E. Butner (ICPADS, 2008)

A design-for-test apparatus for measuring on-chip temperature with fine granularity. - James S. Tandon; Masahiro Sasaki; Makoto Ikeda; Kunihiro Asada (ISQED, 2012)

A stochastic sampling time-to-digital converter with tunable 180-770fs resolution, INL less than 0.6LSB, and selectable dynamic range offset. - James S. Tandon; Takahiro J. Yamaguchi; Satoshi Komatsu; Kunihiro Asada (CICC, 2013)

A novel test structure for measuring the threshold voltage variance in MOSFETs. - Takahiro J. Yamaguchi; James S. Tandon; Satoshi Komatsu; Kunihiro Asada (ITC, 2013)

A Novel Circuit for Transition-Edge Detection: Using a Stochastic Comparator Group to Test Transition-Edge. - Takahiro J. Yamaguchi; James S. Tandon; Satoshi Komatsu; Kunihiro Asada (ATS, 2014)

A subsampling stochastic coarse-fine ADC with SNR 55.3dB and >5.8TS/s effective sample rate for an on-chip signal analyzer. - James S. Tandon; Takahiro J. Yamaguchi; Satoshi Komatsu; Kunihiro Asada (ISCAS, 2014)

A Flash TDC with 2.6-4.2ps Resolution Using a Group of UnbalancedCMOS Arbiters. - Satoshi Komatsu; Takahiro J. Yamaguchi; Mohamed Abbas; Nguyen Ngoc Mai Khanh; James S. Tandon; Kunihiro Asada (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2014)

A comparative study of body biased time-to-digital converters based on stochastic arbiters and stochastic comparators. - James S. Tandon; Satoshi Komatsu; Takahiro J. Yamaguchi; Kunihiro Asada (NEWCAS, 2016)

Beyond Integer Quantization: Approximate Arithmetic for Machine Learning Accelerators : (Invited Paper). - James S. Tandon (ICICDT, 2023)