Operating channel temperature in GaN HEMTs: DC versus RF accelerated life testing. - James W. Pomeroy; Michael J. Uren; Benoit Lambert; Martin Kuball (Microelectron. Reliab., 2015)

On the origin of dynamic Ron in commercial GaN-on-Si HEMTs. - Serge Karboyan; Michael J. Uren; Manikant; James W. Pomeroy; Martin Kuball (Microelectron. Reliab., 2018)

Thermal analysis of semiconductor devices and materials - Why should I not trust a thermal simulation ? - Martin Kuball; James W. Pomeroy; Filip Gucmann; Bahar Oner (BCICTS, 2019)