Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults. - Jennifer Dworak; James Wingfield; Brad Cobb; Sooryong Lee; Li-C. Wang; M. Ray Mercer (DFT, 2002)

Function-Based Dynamic Compaction and its Impact on Test Set Sizes. - James Wingfield; Jennifer Dworak; M. Ray Mercer (DFT, 2003)

Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects. - Jennifer Dworak; Brad Cobb; James Wingfield; M. Ray Mercer (DATE, 2004)

A Preliminary Investigation of Observation Diversity for Enhancing Fortuitous Detection of Defects. - Jennifer Dworak; James Wingfield; M. Ray Mercer (DFT, 2004)

Test Access Mechanism for Multiple Identical Cores. - Grady Giles; Jing Wang; Anuja Sehgal; Kedarnath J. Balakrishnan; James Wingfield (ITC, 2008)

Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor. - Kedarnath J. Balakrishnan; Grady Giles; James Wingfield (IEEE Des. Test Comput., 2009)

Toward more efficient scan data bandwidth utilization on modern SOCs. - Yan Dong; Grady Giles; GuoLiang Li; Jeff Rearick; John Schulze; James Wingfield; Tim Wood 001 (SoCC, 2016)

Maximizing scan pin and bandwidth utilization with a scan routing fabric. - Yan Dong; Grady Giles; GuoLiang Li; Jeff Rearick; John Schulze; James Wingfield; Tim Wood 001 (ITC, 2017)