Reliability of Conformance Tests. - Charles Hagwood; Raghu Kacker; James Yen; David Banks; Lynne Rosenthal; Leonard Gallagher; Paul E. Black (COMPSAC, 1998)

Multimodal biometrics: issues in design and testing. - Robert Snelick; Mike Indovina; James Yen; Alan Mink (ICMI, 2003)