Non Contact Surface Potential Measurements for Charging Reduction During Manufacturing of Metal-Insulator-Metal Capacitors. - Jan Ackaert; Zhichun Wang; Eddy De Backer; P. Colson; Peter Coppens (Microelectron. Reliab., 2001)

Charging induced damage by photoconduction through thick inter metal dielectrics. - Jan Ackaert; Klara Bessemans; Eddy De Backer (Microelectron. Reliab., 2003)

Plasma Charging Damage Reduction in IC Processing by A Self-balancing Interconnect. - Zhichun Wang; Jan Ackaert; Cora Salm; Fred G. Kuper; Eddy De Backer (Microelectron. Reliab., 2004)

MIMC reliability and electrical behavior defined by a physical layer property of the dielectric. - Jan Ackaert; R. Charavel; K. Dhondt; B. Vlachakis; Luc De Schepper; M. Millecam; E. Vandevelde; P. Bogaert; A. Iline; Eddy De Backer; Alexandru Vlad; Jean-Pierre Raskin (Microelectron. Reliab., 2008)

Impact of the leadframe profile on the occurrence of passivation cracks of plastic-encapsulated electronic power devices. - Jan Ackaert; Aditi Malik; Daniel Vanderstraeten (ICICDT, 2013)

Metallization scheme optimization of plastic-encapsulated electronic power devices. - Jan Ackaert; Tony Colpaert; Aditi Malik; Mario Gonzalez (ICICDT, 2015)