Characterization of a Pseudo-Random Testing Technique for Analog and Mixed-Signal Built-in-Self-Test. - Jan Arild Tofte; Chee-Kian Ong; Jiun-Lang Huang; Kwang-Ting (Tim) Cheng (VTS, 2000)

An effort-minimized logic BIST implementation method. - Xinli Gu; Sung Soo Chung; Frank Tsang; Jan Arild Tofte; Hamid Rahmanian (ITC, 2001)

Realizing High Test Quality Goals with Smart Test Resource Usage. - Xinli Gu; Cyndee Wang; Abby Lee; Bill Eklow; Kun-Han Tsai; Jan Arild Tofte; Mark Kassab; Janusz Rajski (ITC, 2004)