Novel C-Element Based Error Detection and Correction Method Combining Time and Area Redundancy. - Jan Belohoubek; Petr Fiser; Jan Schmidt (DSD, 2015)

Error Correction Method Based on the Short-Duration Offline Test. - Jan Belohoubek; Petr Fiser; Jan Schmidt (DSD, 2016)

Error masking method based on the short-duration offline test. - Jan Belohoubek; Petr Fiser; Jan Schmidt (Microprocess. Microsystems, 2017)

KETCube - The Universal Prototyping IoT Platform. - Jan Belohoubek; Jirí Cengery; Jaroslav Freisleben; Petr Kaspar; Ales Hamácek (DSD, 2018)

Using Voters May Lead to Secret Leakage. - Jan Belohoubek; Petr Fiser; Jan Schmidt (DDECS, 2019)

CMOS Illumination Discloses Processed Data. - Jan Belohoubek; Petr Fiser; Jan Schmidt (DSD, 2019)

Standard Cell Tuning Enables Data-Independent Static Power Consumption. - Jan Belohoubek; Petr Fiser; Jan Schmidt (DDECS, 2020)

On the Influence of the Laser Illumination on the Logic Cells Current Consumption : First measurement results. - Dmytro Petryk; Zoya Dyka; Milos Krstic; Jan Belohoubek; Petr Fiser; Frantisek Steiner; Tomás Blecha; Peter Langendörfer; Ievgen Kabin (ICECS, 2023)

On the Influence of the Laser Illumination on the Logic Cells Current Consumption. - Dmytro Petryk; Zoya Dyka; Milos Krstic; Jan Belohoubek; Petr Fiser; Frantisek Steiner; Tomás Blecha; Peter Langendörfer; Ievgen Kabin (CoRR, 2024)

X-Ray Radiation Effects on SRAM-Based TRNG and PUF. - Martin Holec; Jan Belohoubek; Pavel Rous; Tomás Pokorný; Róbert Lórencz; Frantisek Steiner (ICISSP (2), 2025)