Residual analysis to compare measurement series' differences with significance and size measures. - Christian Hatzfeld; Johannes Bilz; Sascha Schlemmer; Jan-Eric Adolf; Yangyang Gu; Steffen Elgner; Mario Kupnik (IEEE SENSORS, 2017)

Force sensor with increased local resolution for electronic Contact Normal Force measurement in electrical connectors. - Felix Greiner; Romol Chadda; Jan-Eric Adolf; Sebastian Beck; Mario Kupnik (IEEE SENSORS, 2019)