MOSFET degradation under DC and RF Fowler-Nordheim stress. - Andrea Cattaneo; Sandro Pinarello; Jan-Erik Mueller; Robert Weigel (ESSDERC, 2014)

Advanced transmitters with combined crest factor reduction and digital predistortion techniques. - Alessio Farabegoli; B. Sogl; Jan-Erik Mueller; Robert Weigel (RWS, 2014)

Impact of DC and RF non-conducting stress on nMOS reliability. - Andrea Cattaneo; Sandro Pinarello; Jan-Erik Mueller; Robert Weigel (IRPS, 2015)