Space Domain Reflectometry for opens detection location in microbumps. - Jan Gaudestad; Vladimir Talanov; Po Chih Huang (Microelectron. Reliab., 2012)

Opens localization on silicon level in a Chip Scale Package using space domain reflectometry. - Jan Gaudestad; Vladimir Talanov; M. Marchetti (Microelectron. Reliab., 2013)

Magnetic Field Imaging for non destructive 3D IC testing. - Jan Gaudestad; Antonio Orozco (Microelectron. Reliab., 2014)

Short localization in CPU FlipChip using thermal imaging and magnetic current imaging: Advanced fault isolation technique comparison. - Jan Gaudestad; Antonio Orozco; Jack Chen (IRPS, 2015)