Advanced SOI CMOS transistor technologies for high-performance microprocessor applications. - Manfred Horstmann; Andy Wei; Jan Hoentschel; Thomas Feudel; Thilo Scheiper; Rolf Stephan; Martin Gerhardt; Stephan Krügel; Michael Raab (CICC, 2009)

RTN and LFN Noise Performance in Advanced FDSOI Technology. - Luca Pirro; Olaf Zimmerhackl; Alban Zaka; Lars Müller-Meskamp; Ranjith Nelluri; Tom Hermann; Ignasi Cortes-Mayol; Andreas Huschka; Michael Otto 003; E. Nowak; Anurag Mittal; Jan Hoentschel (ESSDERC, 2018)

22FDX® fMAX Optimization through Parasitics Reduction and GM Boost. - Zhixing Zhao; Patrick James Artz; Klaus Hempel; Juergen Faul; Tianbing Chen; Richard Taylor; Jerome Mazurier; Carsten Grass; Jan Hoentschel; David Harame; Steffen Lehmann; Luca Lucci; et al. (ESSDERC, 2019)

Low-Frequency Noise Reduction in 22FDX®: Impact of Device Geometry and Back Bias. - Luca Pirro; Alban Zaka; Olaf Zimmerhackl; T. Hermann; Michael Otto 003; E. M. Bazizi; Jan Hoentschel; X. Li; R. Taylor (IRPS, 2019)

22FDSOI device towards RF and mmWave applications. - Zhixing Zhao; Steffen Lehmann; Wei Lun Oo; Amit Kumar Sahoo; Shafi Syed; Quang Huy Le; Dang Khoa Huynh; Talha Chohan; Dirk Utess; Dominik Kleimaier; Maciej Wiatr; Sabine Kolodinski; et al. (BCICTS, 2021)

Comparison of Analog and Noise Performance between Buried Channel versus Surface Devices in HKMG I/O Devices. - Luca Pirro; Aarthi Jayakumar; Olaf Zimmerhackl; Dieter Lipp; Ralf Illgen; Armin Muehlhoff; Ronny Pfuetzner; Alban Zaka; Michael Otto 003; Jan Hoentschel; Yannick Raffel; Konrad Seidel; et al. (IRPS, 2021)

Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance. - Luca Pirro; P. Liebscher; C. Brantz; M. Kessler; H. Herzog; Olaf Zimmerhackl; R. Jain; E. Ebrand; K. Gebauer; Michael Otto 003; Alban Zaka; Jan Hoentschel (IRPS, 2022)

Architecture and Doping Optimization For FSI SPAD In 55nm BCD Lite® Process. - Ping Zheng; Francesco Gramuglia; Yongshun Sun; Yew Tuck Chow; Yongchau Ng; Deepthi Kandasamy; Li Fei Tan; Sally Chwa; Vinit Dhulla; Jan Hoentschel; Eng-Huat Toh (IEEE SENSORS, 2024)