Broadband characterization of high-dielectric constant films for power-ground decoupling. - Jan Obrzut; Natsuko Noda; Ryusuke Nozaki (IEEE Trans. Instrum. Meas., 2002)

High-frequency input impedance characterization of dielectric films for power-ground planes. - Jan Obrzut; Aleksei Anopchenko (IEEE Trans. Instrum. Meas., 2003)

Input impedance of a coaxial line terminated with a complex gap capacitance - numerical and experimental analysis. - Jan Obrzut; Aleksei Anopchenko (IEEE Trans. Instrum. Meas., 2004)

Impedance and nonlinear dielectric testing at high AC voltages using waveforms. - Jan Obrzut; Kenji Kano (IEEE Trans. Instrum. Meas., 2005)

Microwave conductance of semicontinuous metallic films from coplanar waveguide scattering parameters. - Jan Obrzut; Oleg Kirillov (I2MTC, 2013)

Non-contact conductance measurement of nanosize objects using reasonant cavity. - Jan Obrzut; Nathan Orloff; Oleg Kirillov (I2MTC, 2014)