Intelligent Monitoring and Control of Semiconductor Manufacturing Equipment. - Janet L. Murdock; Barbara Hayes-Roth (IEEE Expert, 1991)

Model-matching and individuation for model-based diagnosis. - Janet L. Murdock (1995)

What were you thinking?: filling in missing dataflow through inference in learning from demonstration. - Melinda T. Gervasio; Janet L. Murdock (IUI, 2009)