Correlation of Dynamic and Static Metrics of SRAM Cell under Time-Zero Variability and After NBTI Degradation. - Sarthak Prakash Chaudhari; Jani Babu Shaik; Sonal Singhal; Nilesh Goel (iSES, 2018)

Analysis of SRAM metrics for data dependent BTI degradation and process variability. - Jani Babu Shaik; Sonal Singhal; Nilesh Goel (Integr., 2020)

Design and Mathematical Modelling of Inter Spike Interval of Temporal Neuromorphic Encoder for Image Recognition. - Aadhitiya VS; Jani Babu Shaik; Sonal Singhal; Siona Menezes Picardo; Nilesh Goel (CoRR, 2022)

Investigating the impact of BTI, HCI and time-zero variability on neuromorphic spike event generation circuits. - Jani Babu Shaik; Rohit Singh; Siona Menezes Picardo; Nilesh Goel; Sonal Singhal (CoRR, 2022)

Reliability-aware design of temporal neuromorphic encoder for image recognition. - Jani Babu Shaik; Aadhitiya VS; Sonal Singhal; Nilesh Goel (Int. J. Circuit Theory Appl., 2022)

Impact of various NBTI distributions on SRAM performance for FinFET technology. - Jani Babu Shaik; Sonal Singhal; Siona Menezes Picardo; Nilesh Goel (Integr., 2022)

Enabling efficient rate and temporal coding using reliability-aware design of a neuromorphic circuit. - Siona Menezes Picardo; Jani Babu Shaik; Sonal Singhal; Nilesh Goel (Int. J. Circuit Theory Appl., 2022)

Reliability-aware design of Integrate-and-Fire silicon neurons. - Jani Babu Shaik; Siona Menezes Picardo; Sonal Singhal; Nilesh Goel (Integr., 2024)

Impact of Aging and Process Variability on SRAM-Based In-Memory Computing Architectures. - Jani Babu Shaik; Xinfei Guo; Sonal Singhal (IEEE Trans. Circuits Syst. I Regul. Pap., 2024)

Extending Silicon Lifetime: A Review of Design Techniques for Reliable Integrated Circuits. - Jani Babu Shaik; Fan Hu; Linyu Zhu; Sonal Singhal; Xinfei Guo (CoRR, 2025)

EasySize: Elastic Analog Circuit Sizing via LLM-Guided Heuristic Search. - Xinyue Wu; Fan Hu; Jani Babu Shaik; Yi Zhao; Xinfei Guo (CoRR, 2025)