Reliability assessment of a MEMS microphone under mixed flowing gas environment and shock impact loading. - Jue Li; Mikael Broas; Jani Raami; Toni T. Mattila; Mervi Paulasto-Kröckel (Microelectron. Reliab., 2014)

An approach to adjust the board-level drop test conditions to improve the correlation with product-level drop impact. - Toni T. Mattila; Heikki Ruotoistenmäki; Jani Raami; Jussi Hokka; Manu Mäkelä; Esa Hussa; Markku Sillanpää; Ville Halkola (Microelectron. Reliab., 2014)