An SRAM based testing methodology for yield analysis of semiconductor ICs. - Jannah Al-Hashimi; Seepsa Tomoq; Khaldoon Abugharbieh; Yazan Al-Qudah; Mustafa Shihadeh (ICECS, 2013)

Design of a Switched-Mode Operational Amplifier Operating With a 0.5V Supply Voltage. - Jannah Al-Hashimi; Khaldoon Abugharbieh (NEWCAS, 2021)