Processing and Analysis of Long-Range Scans with an Atomic Force Microscope (AFM) in Combination with Nanopositioning and Nanomeasuring Technology for Defect Detection and Quality Control. - Ingo Ortlepp; Jaqueline Stauffenberg; Eberhard Manske (Sensors, 2021)

Single Dopant Lithography for the Fabrication of Atomic-scale Devices and Quantum Systems. - Ivo W. Rangelow; Thomas Schenkel; Arun Persaud; Zahid Durrani; Mervyn Jones; Hans-Georg Pietscher; Fabian Dietrich; Aditya S. Tan; Jaqueline Stauffenberg; Eberhard Manske; Thomas Fröhlich 002; Dimitre Karpuzov (MIXDES, 2024)