Improving Board and System Test: A Proposal to Integrate Boundary Scan and IDDQ. - Douglas Reed; Jason Doege; Antonio Rubio 001 (ITC, 1995)

AC Scan Path Selection for Physical Debugging. - Alfred L. Crouch; John C. Potter; Jason Doege (IEEE Des. Test Comput., 2003)

IEEE P1687: Toward Standardized Access of Embedded Instrumentation. - Ken Posse; Al Crouch; Jeff Rearick; Bill Eklow; Mike Laisne; Ben Bennetts; Jason Doege; Mike Ricchetti; Jean-Francois Cote (ITC, 2006)

The Advantages of Limiting P1687 to a Restricted Subset. - Jason Doege; Alfred L. Crouch (ITC, 2008)