CAEN-BIST: Testing the NanoFabric. - Jason G. Brown; R. D. (Shawn) Blanton (ITC, 2004)

Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. - Thomas J. Vogels; Thomas Zanon; Rao Desineni; R. D. (Shawn) Blanton; Wojciech Maly; Jason G. Brown; Jeffrey E. Nelson; Y. Fei; X. Huang; Padmini Gopalakrishnan; Mahim Mishra; Vyacheslav Rovner; et al. (ITC, 2004)

Multiple-detect ATPG based on physical neighborhoods. - Jeffrey E. Nelson; Jason G. Brown; Rao Desineni; R. D. (Shawn) Blanton (DAC, 2006)

Extraction of defect density and size distributions from wafer sort test results. - Jeffrey E. Nelson; Thomas Zanon; Rao Desineni; Jason G. Brown; N. Patil; Wojciech Maly; R. D. (Shawn) Blanton (DATE, 2006)

Exploiting Regularity for Inductive Fault Analysis. - Jason G. Brown; R. D. (Shawn) Blanton (VTS, 2006)

Extracting Defect Density and Size Distributions from Product ICs. - Jeffrey E. Nelson; Thomas Zanon; Jason G. Brown; Osei Poku; R. D. (Shawn) Blanton; Wojciech Maly; Brady Benware; Chris Schuermyer (IEEE Des. Test Comput., 2006)

A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology. - Jason G. Brown; R. D. (Shawn) Blanton (J. Electron. Test., 2007)

Automated Testability Enhancements for Logic Brick Libraries. - Jason G. Brown; Brian Taylor; Ronald D. Blanton; Larry T. Pileggi (DATE, 2008)

Automated Standard Cell Library Analysis for Improved Defect Modeling. - Jason G. Brown; R. D. (Shawn) Blanton (ISQED, 2008)