Early reliability assessment by using deep censoring. - Harry A. Schafft; Linda M. Head; Jason Gill; Timothy D. Sullivan (Microelectron. Reliab., 2003)

Application of three-parameter lognormal distribution in EM data analysis. - Baozhen Li; Emmanuel Yashchin; Cathryn Christiansen; Jason Gill; Ronald Filippi; Timothy D. Sullivan (Microelectron. Reliab., 2006)