Zero Trust Approach to IC Manufacturing and Testing. - Brian Buras; Constantinos Xanthopoulos; Ken Butler; Jason Kim 008 (ITC, 2022)

Improvements in Automated IC Socket Pin Defect Detection. - Vijayakumar Thangamariappan; Nidhi Agrawal; Jason Kim 008; Constantinos Xanthopoulos; Ken Butler; Ira Leventhal; Joe Xiao (ITC, 2022)