Cell-aware analysis for small-delay effects and production test results from different fault models. - Friedrich Hapke; Jürgen Schlöffel; Wilfried Redemund; Andreas Glowatz; Janusz Rajski; Michael Reese; J. Rearick; Jason Rivers (ITC, 2011)

EDA solutions to new-defect detection in advanced process technologies. - Erik Jan Marinissen; Gilbert Vandling; Sandeep Kumar Goel; Friedrich Hapke; Jason Rivers; Nikolaus Mittermaier; Swapnil Bahl (DATE, 2012)

Cell-aware Production test results from a 32-nm notebook processor. - Friedrich Hapke; Michael Reese; Jason Rivers; A. Over; V. Ravikumar; Wilfried Redemund; Andreas Glowatz; Jürgen Schlöffel; Janusz Rajski (ITC, 2012)