Fast Design Space Adaptation with Deep Reinforcement Learning for Analog Circuit Sizing. - Kevin-CY Tsai; Kai-En Yang; Hung-Hao Shen; Mike Jiang; Fammy Tsai; Chung-An Wang; Yiju Ting; Jason Yeh; Citi Lai (CoRR, 2020)

Performing Machine Learning Based Outlier Detection for Automotive Grade Products. - Y. L. Yang; P. C. Tsao; C. W. Lin; Ross Lee; Olivia Ni; T. T. Chen; Y. J. Ting; C. T. Lai; Jason Yeh; Arnold Yang; Wayne Huang 003; Peng Chen; et al. (IRPS, 2023)