ESD design rule checker. - Q. Li; Yoonjong Huh; Jau-Wen Chen; Peter Bendix; Sung-Mo Kang (ISCAS (5), 2001)

Full chip ESD design rule checking. - Q. Li; Yoonjong Huh; Jau-Wen Chen; Peter Bendix; Sung-Mo Kang (ISCAS (5), 2001)

ESD-Induced Internal Core Device Failure: New Failure Modes in System-on-Chip (SoC) Designs, invited. - Yoon Huh; Peter Bendix; Kyungjin Min; Jau-Wen Chen; Ravindra Narayan; Larry D. Johnson; Steven H. Voldman (IWSOC, 2005)