Novel electrostatic discharge protection structure for a monolithic gas sensor systems-on-a-chip. - Javier A. Salcedo; Juin J. Liou; Muhammad Yaqub Afridi; Allen R. Hefner (ISCAS (1), 2005)

On-chip electrostatic discharge protection for CMOS gas sensor systems-on-a-chip (SoC). - Javier A. Salcedo; Juin J. Liou; Muhammad Yaqub Afridi; Allen R. Hefner (Microelectron. Reliab., 2006)

Modeling of high voltage devices for ESD event simulation in SPICE. - Yuanzhong Paul Zhou; Javier A. Salcedo; Jean-Jacques Hajjar (Microelectron. J., 2012)

Design optimization of SiGe BiCMOS Silicon Controlled Rectifier for Charged Device Model (CDM) protection applications. - Qiang Cui; Srivatsan Parthasarathy; Javier A. Salcedo; Juin J. Liou; Jean-Jacques Hajjar; Yuanzhong Paul Zhou (Microelectron. Reliab., 2014)

ESD protection clamp with active feedback and mis-trigger immunity in 28nm CMOS process. - Srivatsan Parthasarathy; Javier A. Salcedo; Sandro Herrera; Jean-Jacques Hajjar (IRPS, 2015)

Compact failure modeling for devices subject to electrostatic discharge stresses - A review pertinent to CMOS reliability simulation. - Meng Miao; Yuanzhong Paul Zhou; Javier A. Salcedo; Jean-Jacques Hajjar; Juin J. Liou (Microelectron. Reliab., 2015)

Design and characterization of ESD solutions with EMC robustness for automotive applications. - Yunfeng Xi; Javier A. Salcedo; Yuanzhong Paul Zhou; Juin J. Liou; Jean-Jacques Hajjar (Microelectron. Reliab., 2015)

ESD protection structure with reduced capacitance and overshoot voltage for high speed interface applications. - Aihua Dong; Javier A. Salcedo; Srivatsan Parthasarathy; Yuanzhong Paul Zhou; Sirui Luo; Jean-Jacques Hajjar; Juin J. Liou (Microelectron. Reliab., 2017)

Characterization and Modeling of the Transient Safe Operating Area in LDMOS Transistors. - Hang Li; Kalpathy B. Sundaram; Yuanzhong Paul Zhou; Javier A. Salcedo; Jean-Jacques Hajjar (IRPS, 2019)