Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs. - Javier Martín-Martínez; Simone Gerardin; Rosana Rodríguez; Montserrat Nafría; Xavier Aymerich; Andrea Cester; Alessandro Paccagnella; G. Ghidini (Microelectron. Reliab., 2007)

Worn-out oxide MOSFET characteristics: Role of gate current and device parameters on a current mirror. - Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Xavier Aymerich; James H. Stathis (Microelectron. Reliab., 2007)

Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies. - Georges G. E. Gielen; Pieter De Wit; Elie Maricau; Johan Loeckx; Javier Martín-Martínez; Ben Kaczer; Guido Groeseneken; Rosana Rodríguez; Montserrat Nafría (DATE, 2008)

Reversible dielectric breakdown in ultrathin Hf based high-k stacks under current-limited stresses. - Albert Crespo-Yepes; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Xavier Aymerich (Microelectron. Reliab., 2009)

Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks. - Enrique Miranda 002; Javier Martín-Martínez; Eamon O'Connor; G. Hughes; P. Casey; Karim Cherkaoui; S. Monaghan; R. Long; D. O'Connell; Paul K. Hurley (Microelectron. Reliab., 2009)

SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors. - Javier Martín-Martínez; Esteve Amat; M. B. González; P. Verheyen; Rosana Rodríguez; Montserrat Nafría; Xavier Aymerich; Eddy Simoen (Microelectron. Reliab., 2010)

Shape-shifting digital hardware concept: Towards a new adaptive computing system. - Carmen G. Almudéver; Antonio Rubio 001; Javier Martín-Martínez; Albert Crespo-Yepes; Rosana Rodríguez; Montserrat Nafría (AHS, 2012)

Unified characterization of RTN and BTI for circuit performance and variability simulation. - Nuria Ayala; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Xavier Aymerich (ESSDERC, 2012)

Characterization and SPICE modeling of the CHC related time-dependent variability in strained and unstrained pMOSFETs. - Nuria Ayala; Javier Martín-Martínez; Rosana Rodríguez; M. B. González; Montserrat Nafría; Xavier Aymerich; Eddy Simoen (Microelectron. Reliab., 2012)

Resistive switching like-behavior in MOSFETs with ultra-thin HfSiON dielectric gate stack: pMOS and nMOS comparison and reliability implications. - Albert Crespo-Yepes; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Xavier Aymerich (Microelectron. Reliab., 2013)

Influence of the interface trap location on the performance and variability of ultra-scaled MOSFETs. - V. Velayudhan; Francisco Gámiz; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Xavier Aymerich (Microelectron. Reliab., 2013)

A shapeshifting evolvable hardware mechanism based on reconfigurable memFETs crossbar architecture. - Javier Martín-Martínez; Carmen G. Almudéver; Albert Crespo-Yepes; Rosana Rodríguez; Montserrat Nafría; Antonio Rubio 001 (Microelectron. Reliab., 2014)

Threshold voltage and on-current Variability related to interface traps spatial distribution. - V. Velayudhan; Javier Martín-Martínez; Marc Porti; Carlos Couso; Rosana Rodríguez; Montserrat Nafría; Xavier Aymerich; Carlos Marquez; Francisco Gámiz (ESSDERC, 2015)

Connecting the physical and application level towards grasping aging effects. - Hussam Amrouch; Javier Martín-Martínez; Victor M. van Santen; Miquel Moras; Rosana Rodríguez; Montserrat Nafría; Jörg Henkel (IRPS, 2015)

Designing guardbands for instantaneous aging effects. - Victor M. van Santen; Hussam Amrouch; Javier Martín-Martínez; Montserrat Nafría; Jörg Henkel (DAC, 2016)

Reliability simulation for analog ICs: Goals, solutions, and challenges. - Antonio Toro-Frías; Pablo Martín-Lloret; Javier Martín-Martínez; Rafael Castro-López; Elisenda Roca; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (Integr., 2016)

A size-adaptive time-step algorithm for accurate simulation of aging in analog ICs. - Pablo Martín-Lloret; Antonio Toro-Frías; Javier Martín-Martínez; Rafael Castro-López; Elisenda Roca; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (ISCAS, 2017)

TARS: A toolbox for statistical reliability modeling of CMOS devices. - Javier Diaz-Fortuny; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001 (SMACD, 2017)

A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging. - Javier Diaz-Fortuny; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001; Enrique Barajas; Xavier Aragonès; Diego Mateo (SMACD, 2017)

CASE: A reliability simulation tool for analog ICs. - Pablo Martín-Lloret; Antonio Toro-Frías; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría (SMACD, 2017)

Statistical characterization and modeling of random telegraph noise effects in 65nm SRAMs cells. - Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Gabriel Torrens; Sebastià A. Bota; Jaume Segura 001; Francesc Moll; Antonio Rubio 001 (SMACD, 2017)

Including a stochastic model of aging in a reliability simulation flow. - Antonio Toro-Frías; Pablo Martín-Lloret; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría (SMACD, 2017)

Investigation of Conductivity Changes in Memristors under Massive Pulsed Characterization. - Marta Pedro; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Xavier Aymerich (DCIS, 2018)

CMOS Characterization and Compact Modelling for Circuit Reliability Simulation. - Javier Diaz-Fortuny; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001 (IOLTS, 2018)

Device variability tolerance of a RRAM-based self-organizing neuromorphic system. - Marta Pedro; Javier Martín-Martínez; Enrique Miranda 002; Rosana Rodríguez; Montserrat Nafría; M. B. González; Francesca Campabadal (IRPS, 2018)

Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability. - Victor M. van Santen; Javier Diaz-Fortuny; Hussam Amrouch; Javier Martín-Martínez; Rosana Rodríguez; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001; Jörg Henkel; Montserrat Nafría (IRPS, 2018)

Analysis of Body Bias and RTN-Induced Frequency Shift of Low Voltage Ring Oscillators in FDSOI Technology. - Enrique Barajas; Xavier Aragonès; Diego Mateo; Francesc Moll; Antonio Rubio 001; Javier Martín-Martínez; Rosana Rodríguez; Marc Porti; Montserrat Nafría; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001 (PATMOS, 2018)

A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation. - Javier Diaz-Fortuny; Pablo Saraza-Canflanca; Antonio Toro-Frías; Rafael Castro-López; Javier Martín-Martínez; Elisenda Roca; Rosana Rodríguez; Francisco V. Fernández 001; Montserrat Nafría (SMACD, 2018)

Automated Massive RTN Characterization Using a Transistor Array Chip. - Pablo Saraza-Canflanca; Javier Diaz-Fortuny; Antonio Toro-Frías; Rafael Castro-López; Elisenda Roca; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (SMACD, 2018)

Design Considerations of an SRAM Array for the Statistical Validation of Time-Dependent Variability Models. - Pablo Saraza-Canflanca; D. Malagon; Fábio Passos; A. Toro; Juan Núñez 002; Javier Diaz-Fortuny; Rafael Castro-López; Elisenda Roca; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (SMACD, 2018)

Lifetime Calculation Using a Stochastic Reliability Simulator for Analog ICs. - Antonio Toro-Frías; Pablo Martín-Lloret; Javier Martín-Martínez; Rafael Castro-López; Elisenda Roca; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (SMACD, 2018)

Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV. - Victor M. van Santen; Javier Martín-Martínez; Hussam Amrouch; Montserrat Nafría; Jörg Henkel (IEEE Trans. Circuits Syst. I Regul. Pap., 2018)

New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors. - Pablo Saraza-Canflanca; Javier Diaz-Fortuny; Rafael Castro-López; Elisenda Roca Moreno; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (DATE, 2019)

Generation of Lifetime-Aware Pareto-Optimal Fronts Using a Stochastic Reliability Simulator. - Antonio Toro-Frías; Pablo Saraza-Canflanca; Fábio Passos; Pablo Martín-Lloret; Rafael Castro-López; Elisenda Roca; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (DATE, 2019)

Noise-induced Performance Enhancement of Variability-aware Memristor Networks. - Vasileios G. Ntinas; Iosif-Angelos Fyrigos; Georgios Ch. Sirakoulis; Antonio Rubio 001; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría (ICECS, 2019)

A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices. - G. Pedreira; Javier Martín-Martínez; Javier Diaz-Fortuny; Pablo Saraza-Canflanca; Rosana Rodríguez; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001; Montserrat Nafría (IRPS, 2019)

Aging in CMOS RF Linear Power Amplifiers: Experimental Comparison and Modeling. - Xavier Aragonès; Diego Mateo; Enrique Barajas; Albert Crespo-Yepes; Rosana Rodríguez; Javier Martín-Martínez; Montserrat Nafría (ISCAS, 2019)

An IC Array for the Statistical Characterization of Time-Dependent Variability of Basic Circuit Blocks. - Pablo Martín-Lloret; Juan Núñez 002; Elisenda Roca; Rafael Castro-López; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (SMACD, 2019)

Experimental Characterization of Time-Dependent Variability in Ring Oscillators. - Juan Núñez 002; Elisenda Roca; Rafael Castro-López; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (SMACD, 2019)

TiDeVa: A Toolbox for the Automated and Robust Analysis of Time-Dependent Variability at Transistor Level. - Pablo Saraza-Canflanca; Javier Diaz-Fortuny; Rafael Castro-López; Elisenda Roca; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (SMACD, 2019)

A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI. - Javier Diaz-Fortuny; Javier Martín-Martínez; Rosana Rodríguez; Rafael Castro-López; Elisenda Roca; Xavier Aragonès; Enrique Barajas; Diego Mateo; Francisco V. Fernández 001; Montserrat Nafría (IEEE J. Solid State Circuits, 2019)

Experimental Verification of Memristor-Based Material Implication NAND Operation. - Marcos Maestro-Izquierdo; Javier Martín-Martínez; Albert Crespo-Yepes; Manel Escudero; Rosana Rodríguez; Montserrat Nafría; Xavier Aymerich; Antonio Rubio 001 (IEEE Trans. Emerg. Top. Comput., 2019)

Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation. - Rosana Rodríguez; Albert Crespo-Yepes; Javier Martín-Martínez; Montserrat Nafría; Xavier Aragonès; Diego Mateo; Enrique Barajas (IRPS, 2020)

A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level. - Pablo Saraza-Canflanca; Javier Diaz-Fortuny; Rafael Castro-López; Elisenda Roca; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (Integr., 2020)

Flexible Setup for the Measurement of CMOS Time-Dependent Variability With Array-Based Integrated Circuits. - Javier Diaz-Fortuny; Pablo Saraza-Canflanca; Rafael Castro-López; Elisenda Roca; Javier Martín-Martínez; Rosana Rodríguez; Francisco V. Fernández 001; Montserrat Nafría (IEEE Trans. Instrum. Meas., 2020)

Power-Efficient Noise-Induced Reduction of ReRAM Cell's Temporal Variability Effects. - Vasileios G. Ntinas; Antonio Rubio 001; Georgios Ch. Sirakoulis; Emili Salvador Aguilera; Marta Pedro; Albert Crespo-Yepes; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría (IEEE Trans. Circuits Syst. II Express Briefs, 2021)

Beneficial Role of Noise in Hf-based Memristors. - Rosana Rodríguez; Javier Martín-Martínez; Emili Salvador Aguilera; Albert Crespo-Yepes; Enrique Miranda 002; Montserrat Nafría; Antonio Rubio 001; Vasileios G. Ntinas; Georgios Ch. Sirakoulis (ISCAS, 2022)

A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation. - Pablo Saraza-Canflanca; Javier Martín-Martínez; Elisenda Roca; Rafael Castro-López; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (SMACD, 2022)

On the Impact of the Biasing History on the Characterization of Random Telegraph Noise. - Pablo Saraza-Canflanca; Rafael Castro-López; Elisenda Roca; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Francisco V. Fernández 001 (IEEE Trans. Instrum. Meas., 2022)

Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability. - Javier Martín-Martínez; Javier Diaz-Fortuny; Pablo Saraza-Canflanca; Rosana Rodríguez; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001; Montserrat Nafría (IRPS, 2023)

Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices. - Francisco V. Fernández 001; Elisenda Roca; Pablo Saraza-Canflanca; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Rafael Castro-López (SMACD, 2023)