Analysis and detection of hard-to-detect full open defects in FinFET based SRAM cells. - Zahira Perez; Javier Mesalles; Hector Villacorta; Fabian Vargas 001; Víctor H. Champac (LATS, 2020)

Analysis and Detection of Open-gate Defects in Redundant Structures of a FinFET SRAM Cell. - Víctor H. Champac; Javier Mesalles; Hector Villacorta; Fabian Vargas 001 (J. Electron. Test., 2021)