The scan-DFT features of AMD's next-generation microprocessor core. - Mahmut Yilmaz; Baosheng Wang; Jayalakshmi Rajaraman; Tom Olsen; Kanwaldeep Sobti; Dwight Elvey; Jeff Fitzgerald; Grady Giles; Wei-Yu Chen (ITC, 2010)

Structural tests of slave clock gating in low-power flip-flop. - Baosheng Wang; Jayalakshmi Rajaraman; Kanwaldeep Sobti; Derrick Losli; Jeff Rearick (VTS, 2011)