Current Crowding Impact on Electromigration in Al Interconnects. - Young-Joon Park; Jungwoo Joh; Jayhoon Chung; Srikanth Krishnan (IRPS, 2019)

Reliability of Metal-Dielectric Structures Under Intermittent Current Pulsing. - Chung-Shuo Lee; Pavan Kumar Vaitheeswaran; Ganesh Subbarayan; Young-Joon Park; Jayhoon Chung; Srikanth Krishnan (IRPS, 2020)